MCP -- Index by Author (Feb 2005; Volume 4, Number 2)

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Index by Author: Feb 2005; 4 (2) [Table of Contents]

A | B | C | D | E | F | G | H | I | J | K | L | M | N | O | P | Q | R | S | T | U | V | W | X | Y | Z

A: Aebersold, Ruedi [Abstract] [Full Text]; Aebersold, Ruedi [Abstract] [Full Text]; Albers, Michael [Abstract] [Full Text]; Andersen, Raymond [Abstract] [Full Text]; Auersperg, Nelly [Abstract] [Full Text]
B: Bagshaw, Richard D. [Abstract] [Full Text]; Burlingame, Alma L. [Abstract] [Full Text]
C: Callahan, John W. [Abstract] [Full Text]; Camp, David G., II [Abstract] [Full Text]; Chan, King C. [Abstract] [Full Text]; Comb, Michael J. [Abstract] [Full Text]; Cong, Yu-Sheng [Abstract] [Full Text]; Conrads, Thomas P. [Abstract] [Full Text]
D: De Winter, Fred [Abstract] [Full Text]
E: Eng, Jimmy [Abstract] [Full Text]
F: Fung, Kit W. [Abstract] [Full Text]
G: Godwin, Andrew K. [Abstract] [Full Text]; Gouwenberg, Yvonne [Abstract] [Full Text]
H: Han, David [Abstract] [Full Text]; Han, David [Abstract] [Full Text]; Højrup, Peter [Abstract] [Full Text]; Hornshaw, Martin P. [Abstract] [Full Text]; Hwang, Sun-Il [Abstract] [Full Text]
J: Jiménez, Connie R. [Abstract] [Full Text]
K: Kaiser, Carmen [Abstract] [Full Text]; Karsan, Aly [Abstract] [Full Text]; Kelly-Spratt, Karen S. [Abstract] [Full Text]; Kemp, Christopher J. [Abstract] [Full Text]; Kern, Rainer [Abstract] [Full Text]; Klink, Martin [Abstract] [Full Text]; Kober, Ingo [Abstract] [Full Text]; Koegl, Manfred [Abstract] [Full Text]; Kranz, Harald [Abstract] [Full Text]
L: Larsen, Martin R. [Abstract] [Full Text]; Li, Ka Wan [Abstract] [Full Text]; Li, Xiao-jun [Abstract] [Full Text]; Lucas, David A. [Abstract] [Full Text]
M: Mahuran, Don J. [Abstract] [Full Text]; Mallick, Parag [Abstract] [Full Text]; Masselon, Christophe D. [Abstract] [Full Text]; Mayya, Viveka [Abstract] [Full Text]; Mayya, Viveka [Abstract] [Full Text]
P: Pan, Sheng [Abstract] [Full Text]; Patterson, Dale [Abstract] [Full Text]; Pollet, Ingrid [Abstract] [Full Text]
R: Rezaul, Karim [Abstract] [Full Text]; Rezaul, Karim [Abstract] [Full Text]; Roepstorff, Peter [Abstract] [Full Text]; Rush, John [Abstract] [Full Text]
S: Smit, August B. [Abstract] [Full Text]; Smith, Richard D. [Abstract] [Full Text]; Smith-Beckerman, Diana M. [Abstract] [Full Text]; Stam, Floor J. [Abstract] [Full Text]; Suckow, Jörg [Abstract] [Full Text]
V: Veenstra, Timothy [Abstract] [Full Text]; Verhaagen, Joost [Abstract] [Full Text]
W: Williams, Katherine E. [Abstract] [Full Text]; Wu, Linfeng [Abstract] [Full Text]
Y: Yi, Eugene C. [Abstract] [Full Text]; Yu, Li-Rong [Abstract] [Full Text]
Z: Zhang, Hui [Abstract] [Full Text]; Zhang, Hui [Abstract] [Full Text]; Zhang, Ning [Abstract] [Full Text]

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